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Japan APOLLOWAVE 8-inch Manual probe station Alpha200

Second-hand Equipment Sales Project
Power Device Analyzer

Japan APOLLOWAVE 12-inch Manual probe station Alpha300

IC Touch
Temperature change test platform after packaging
Can do temperature change test for the chip after packaging
Temperature range -40 ~ 150°C
Can customized variable temperature head for IC packaging

WAT low leakage high and low temperature electrical probe card
Suitable for semi automated probe station or fully automated probe station

APW RF probe card
Probe card for RF / DC / PCM / WLR measurement

Japan APOLLOWAVE 8-inch Semi-automated wafer probe station AP-200

1000X magnification will be best performance

Stereo microscope
300X magnification will be best performance

Metallographic microscope
1.High resolution
2. 2000X magnification will be best performance

Coaxial probe arm

Triaxial probe arm