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- Industry leadership in high-power probe stations - High-power device measurement service laboratory - Tailored testing solutions for third-generation semiconductors
- Full range of high-power probe stations: manual, semi-automated and fully automated
- Advanced thermal management and low-loss probing for optimal performance
Japan APOLLOWAVE Semi-automated Probe Station AP-300
AP-300 12-inch semi-automated probe station features motorized stage control, programmable testing capabilities, precise probe alignment, and support for up to 12-inch wafers, offering a versatile platform for high-precision semiconductor testing and characterization.
SJD AK-200 8-inch manual probe station offers enhanced versatility for testing larger semiconductor devices, precise manual control for accurate probe placement and a robust design that accommodates various testing environments, supports up to 8-inch wafers.
APOLLOWAVE Vacuum Semi-Auto Probe Station combines automated probe positioning with a controlled vacuum environment, offering precise electrical testing of semiconductor devices while minimizing contamination and ensuring accurate measur
The B1505A is a Curve Tracer from Agilent. A curve tracer, or curve checker, is a type of electronic test equipment engineers use to analyze semiconductor device characteristics. Curve tracers contain current and voltage sources to stimulate the equipment under test (EUT). A curve tracer applies a swept voltage to two terminals of the EUT, measuring the level of current flowing at each voltage.
Japan APOLLOWAVE WAT Probe Card (low leakage high and low temperature electrical)
Suitable for semi automated probe station or fully automated probe station
Japan APOLLOWAVE Semi-automated Probe Station AP-200
AP-200 8-inch semi-automated probe station features motorized stage movement for precise alignment, programmable testing capabilities for efficient workflows, high-resolution optical viewing systems and the ability to accommodate up to 8-inch wafers.
A triaxial probe is built for precise electrical measurements, using three conductive layers to reduce noise and improve signal quality for testing sensitive semiconductor devices and high-frequency applications.
SJD-3000V/20A Test fixture for high-voltage and high-current, providing electrical connections for signal testing and power testing, allowing precise measurement and analysis.
