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OUR VISION

About us

- Industry leadership in high-power probe stations
- High-power device measurement service laboratory
- Tailored testing solutions for third-generation semiconductors

- Full range of high-power probe stations: manual, semi-automated and fully automated
- Advanced thermal management and low-loss probing for optimal performance
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About us
OUR PRODUCT

Product

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Japan APOLLOWAVE Semi-automated Probe Station AP-300
AP-300 12-inch semi-automated probe station features motorized stage control, programmable testing capabilities, precise probe alignment, and support for up to 12-inch wafers, offering a versatile platform for high-precision semiconductor testing and characterization.
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SJD AK-200 8-inch Manual Probe Station
SJD AK-200 8-inch manual probe station offers enhanced versatility for testing larger semiconductor devices, precise manual control for accurate probe placement and a robust design that accommodates various testing environments, supports up to 8-inch wafers.
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Japan APOLLOWAVE Vacuum Semi-Auto Probe Station
APOLLOWAVE Vacuum Semi-Auto Probe Station combines automated probe positioning with a controlled vacuum environment, offering precise electrical testing of semiconductor devices while minimizing contamination and ensuring accurate measur
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Keysight B1505A Power Device Analyzer
The B1505A is a Curve Tracer from Agilent. A curve tracer, or curve checker, is a type of electronic test equipment engineers use to analyze semiconductor device characteristics. Curve tracers contain current and voltage sources to stimulate the equipment under test (EUT). A curve tracer applies a swept voltage to two terminals of the EUT, measuring the level of current flowing at each voltage.
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WAT Probe Card
Japan APOLLOWAVE WAT Probe Card (low leakage high and low temperature electrical)
Suitable for semi automated probe station or fully automated probe station
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Japan APOLLOWAVE Semi-automated Probe Station AP-200
AP-200 8-inch semi-automated probe station features motorized stage movement for precise alignment, programmable testing capabilities for efficient workflows, high-resolution optical viewing systems and the ability to accommodate up to 8-inch wafers.
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SJD-Triaxial Probe Set
A triaxial probe is built for precise electrical measurements, using three conductive layers to reduce noise and improve signal quality for testing sensitive semiconductor devices and high-frequency applications.
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SJD-3000V/20A Test Fixture
SJD-3000V/20A Test fixture for high-voltage and high-current, providing electrical connections for signal testing and power testing, allowing precise measurement and analysis.
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OUR SERVICE

Service

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