Japan APOLLOWAVE Semi-automated Probe Station AP-150
AP-150 6-inch semi-automated probe station offers precise manual and automated wafer probing with motorized stage movement, programmable testing sequences, high-accuracy probe placement and compatibility with up to 6-inch wafers.
Japan APOLLOWAVE Semi-automated Probe Station AP-300
AP-300 12-inch semi-automated probe station features motorized stage control, programmable testing capabilities, precise probe alignment, and support for up to 12-inch wafers, offering a versatile platform for high-precision semiconductor testing and characterization.
Alpha200CS 8-inch chamber-type manual probe station provides precise manual control for probing, a sealed environment for controlled testing conditions such as vacuum and supports up to 8-inch wafers.
SJD AK-100 4-inch manual probe station offers precise manual probe control, a stable platform for accurate alignment and support for up to 4-inch wafers.
SJD AK-150 6-inch manual probe station allows researchers to perform precise electrical testing on larger semiconductor devices while maintaining hands-on control for optimal probe placement and alignment.
SJD AKS-200 8-inch semi-automated probe station offers precise wafer testing with semi-automated control, supporting wafers up to 8 inches. Features high-precision probing, a user-friendly interface and flexibility for high-power, high-frequency and high-temperature applications.
SJD AK-200 8-inch manual probe station offers enhanced versatility for testing larger semiconductor devices, precise manual control for accurate probe placement and a robust design that accommodates various testing environments, supports up to 8-inch wafers.
APOLLOWAVE Vacuum Semi-Auto Probe Station combines automated probe positioning with a controlled vacuum environment, offering precise electrical testing of semiconductor devices while minimizing contamination and ensuring accurate measur
The B1500A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.
The B1505A is a Curve Tracer from Agilent. A curve tracer, or curve checker, is a type of electronic test equipment engineers use to analyze semiconductor device characteristics. Curve tracers contain current and voltage sources to stimulate the equipment under test (EUT). A curve tracer applies a swept voltage to two terminals of the EUT, measuring the level of current flowing at each voltage.
The 4155C is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.
Calibrations
Japan APOLLOWAVE Semi-automated Probe Station AP-150
Japan APOLLOWAVE Semi-automated Probe Station AP-300
Japan APOLLOWAVE Manual Probe Station Alpha200CS
SJD AK-100 4-inch Manual Probe Station
SJD AK-150 6-inch Manual Probe Station
SJD AKS-200 8-inch Semi-automated Probe Station
SJD AK-DS-200 Double-Side Probe Station
SJD AK-200 8-inch Manual Probe Station
Japan APOLLOWAVE Vacuum Semi-Auto Probe Station
Keysight B1500A Semiconductor Device Parameter Analyzer
Keysight B1505A Power Device Analyzer
4155C Agilent Semiconductor Parameter Analyzer
