Manual Probe Station

Alpha200CS 8-inch chamber-type manual probe station provides precise manual control for probing, a sealed environment for controlled testing conditions such as vacuum and supports up to 8-inch wafers.

SJD AK-100 4-inch manual probe station offers precise manual probe control, a stable platform for accurate alignment and support for up to 4-inch wafers.

SJD AK-150 6-inch manual probe station allows researchers to perform precise electrical testing on larger semiconductor devices while maintaining hands-on control for optimal probe placement and alignment.

Alpha100 4-inch manual probe station offers precise manual probe control, a stable platform for accurate alignment, and support for up to 4-inch wafers, making it suitable for cost-effective semiconductor testing and research applications.

Alpha150 6-inch manual probe station allows researchers to perform precise electrical testing on larger semiconductor devices while maintaining hands-on control for optimal probe placement and alignment and support for up to 6-inch wafers.

Alpha200 8-inch manual probe station offers enhanced versatility for testing larger semiconductor devices, precise manual control for accurate probe placement, and a robust design that accommodates various testing environments, making it ideal for both research and development applications.

Alpha300 12-inch manual probe station offers the advantage of handling larger semiconductor wafers with precise manual control for optimal probe placement, facilitating accurate electrical testing and characterization in research and development environments.

MBP-55 Compact Desktop Prober is an integrated, lightweight device optimized for chip-level IV/CV measurements, supporting sample sizes up to 50 mm, and capable of measuring low-level current IV, capacitance CV, and RF, all while being easily portable.