Probe Station Accessories

A zoom type microscope provides continuous magnification, high-resolution optics, a wide zoom range with a large working distance for versatile and precise observation of wafers without lens changes.

A stereo microscope offers a wide field of view, a long working distance, and allows for comfortable binocular viewing through the lens barrel for enhanced depth perception.

A metallographic microscope is designed for high-resolution observation of metal surfaces, specialized optics for examining polished or etched samples, and the ability to analyze material structures at various magnifications.

A coaxial probe arm ensures precise electrical contact and measurements by featuring a central conductor with an outer shield to minimize interference and provide accurate signal transmission for semiconductor and RF device testing.

A triaxial probe arm is built for precise electrical measurements, using three conductive layers to reduce noise and improve signal quality for testing sensitive semiconductor devices and high-frequency applications.

M60 micromanipulator for high-frequency probes provides precise positioning and fine adjustments for accurate probe alignment.

M40 micromanipulator provides precise positioning and fine adjustments for accurate probe alignment.

M30 micromanipulator provides precise positioning and fine adjustments for accurate probe alignment.

M20 micromanipulator provides precise positioning and fine adjustments for accurate probe alignment.