Probe card

Japan APOLLOWAVE WAT Probe Card (low leakage high and low temperature electrical)
Suitable for semi automated probe station or fully automated probe station

Japan APOLLOWAVE RF Probe Card
Probe card for RF / DC / PCM / WLR measurement

Cantilever type with xcellent cost performance

Probe cards for low current and high temperature measurements

Use coaxial probe to achieve superior high frequency characteristics

The DC Multi-contact Probe can be installed in the same positioner as the high-frequency probe, supports random pin pitch with LCR chip parts mounted near the device for oscillation countermeasures, accommodates up to 20 pins, and can be made with tungsten, BeCu, Pd, or Ir needles.

The Probe Card for High Power Measurement handles over 10 kV and 200 A, prevents high voltage discharge, uses iridium needles for high current support, connects to various measuring instruments and is suitable for both development and mass production lines.

The parametric probe card enables measurements under low and high temperatures (-55°C to 200°C), can measure low currents (<10 fA), and is compatible with Agilent 4060, 4070, and 4080 models.