Semi-Auto Probe Station

  1. Semi-Auto Probe Station
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    Japan APOLLOWAVE Semi-automated Probe Station AP-150

    AP-150 6-inch semi-automated probe station offers precise manual and automated wafer probing with motorized stage movement, programmable testing sequences, high-accuracy probe placement and compatibility with up to 6-inch wafers.
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    Japan APOLLOWAVE Semi-automated Probe Station AP-300

    AP-300 12-inch semi-automated probe station features motorized stage control, programmable testing capabilities, precise probe alignment, and support for up to 12-inch wafers, offering a versatile platform for high-precision semiconductor testing and characterization.
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    SJD AKS-200 8-inch Semi-automated Probe Station

    SJD AKS-200 8-inch semi-automated probe station offers precise wafer testing with semi-automated control, supporting wafers up to 8 inches. Features high-precision probing, a user-friendly interface and flexibility for high-power, high-frequency and high-temperature applications.
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    Japan APOLLOWAVE Semi-automated Probe Station AP-200

    AP-200 8-inch semi-automated probe station features motorized stage movement for precise alignment, programmable testing capabilities for efficient workflows, high-resolution optical viewing systems and the ability to accommodate up to 8-inch wafers.