Semi-Auto Probe Station

  1. Semi-Auto Probe Station
Japan APOLLOWAVE Semi-automated Probe Systems AP-300

Japan APOLLOWAVE Semi-automated Probe Systems AP-300

Japan APOLLOWAVE 12-inch Semi-automated wafer probe station AP-300
12-inch semi-auto probe station a300.jpg
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  • 12-inch semi-auto probe station a300.jpg
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DETAIL
12-inch Semi-automated wafer probe station
- Temperature characteristic evaluation from -60°C to +350°C
- Probe solution for high-power devices. 20kV DC/200A
- Has a compact shield to prevent dew condensation
- The compact shield provides a low noise environment
- Probe station equipped with APOLLOWAVE proprietary software realizes high test efficiency
- By image recognition, automatic wafer alignment and automatic chip alignment are possible
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