Agilent

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Keysight B1500A Semiconductor Device Parameter Analyzer

Keysight B1500A Semiconductor Device Parameter Analyzer

The B1500A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.
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DETAIL

Additional Features

  • PC-based instrument with Microsoft ® Windows ® OS and EasyEXPERT software
  • Single-box solution for current-voltage (IV), capacitance-voltage (CV), pulse generation, fast IV, and time-domain measurement.
  • Ten module slots for source monitor units (SMUs) and other module types (MFCMU, HV-SPGU and WGFMU)
  • Offline data analysis and application test development via Desktop EasyEXPERT software

Measurement Capabilities

  • Supports current-voltage (IV) measurement to 0.1fA and 0.5µV
  • Supports both quasi-static and medium-frequency capacitance-voltage (CV) measurement
  • Supports accurate fast IV and time-domain measurement for a wide range of applications such as pulsed IV, NBTI and RTS noise (RTN) measurement
  • Supports high voltage pulse generation (up to ±40 V) for high power and memory device testing

Mainframe features

  • Configurable and upgradeable measurement modules up to 10 slots in a box
  • 15-inch wide touch screen supports intuitive GUI operation of the EasyEXPERT group+
  • Windows Embedded Standard 7 (WES7)
  • GPIB, USB, LAN interfaces, and VGA video output port

The Agilent B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements and also fast high-voltage pulsing. Its familiar, Microsoft ® Windows ® user interface supports Agilent's EasyEXPERT software, which provides a new, more intuitive task-oriented approach to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Agilent B1500A can be used for a wide range of semiconductor device characterization needs (IC-CAP supports the Agilent B1500A). It is also an excellent solution for non-volatile memory cell characterization and high-speed device characterization (including advanced NBTI and RTS noise (RTN) measurement).

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