Japan Apollowave high quality low leakage probe card
- Advanced Ceramic technology makes low leakage and noise current
- Wide temperature range from -40 up to 200 °C
- Small pad technology pad size up to 30 um
- One pin replacement
- Long life time more than 500K touchdowns
- Low leakage
- Can withstand high temperature to 300 °C
- Fast maintenance
- 1 million contact life
- High voltage 3000V, high current 100A option
- For 4.5 inch probe card holder
- For 4060/4070/4080 series testers
- Advanced Ceramic technology makes low leakage and noise current
- Wide temperature range from -40 up to 200 °C
- Small pad technology pad size up to 30 um
- One pin replacement
- Long life time more than 500K touchdowns
- Low leakage
- Can withstand high temperature to 300 °C
- Fast maintenance
- 1 million contact life
- High voltage 3000V, high current 100A option
- For 4.5 inch probe card holder
- For 4060/4070/4080 series testers